Description

The new Leica DM1750 M is a material microscope designed for rapid, accurate analysis results even for a use in rough ambient conditions.Working with the Leica DM1750 M you will see, how simple and reliable microscopy can be. Its robust design contains an excellent optical system and allows the inspection even of larger samples, in brightfield, oblique- or with polarized light. The entire reflected light illumination is carried out with Power-LEDs which allow an inspection with different illumination angles, especially suitable for the detection of micro scratches or for gaining height information.